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AFG31000 Series


AFG31000 images GIF



 Data Sheet

Arbitrary Function Generator

The AFG31000 series with InstaView™ technology is the first high-performance AFG with built-in waveform generation applications, patented real-time wave monitoring, and a modern user interface.







Verify your waveform at the DUT


Patented InstaView™ technology enables you to view the real waveform at the device under test (DUT) directly on the AFG without the need for an oscilloscope, probes, or additional equipment, saving test time and eliminating the risk of unmatched impedance in your test results.



Double Pulse Test in Under a Minute

Double Pulse Test_video_thumb


The AFG31000 is the first function generator on the market that includes built-in double pulse test software. Now you can generate two waveforms with varying pulse widths (from 20 ns to 150 µs) in under a minute directly on the touchscreen display. No need for an external PC application or manual programming.

Measure switching parameters and evaluate the dynamic behaviors of MOSFET and IGBT power devices.

  Double Pulse Test Application Note Download the Double Pulse Application Note


High-fidelity signals with advanced mode

Generate long, precise waveforms in continuous mode with lengths up to 16 Mpts per channel right out-of-the-box. Variable sampling clock technology guarantees you will never lose any waveform data. Available upgrades let you take your testing to the next level and build and program complex waveforms at one-tenth the cost of a traditional AWG.

With optional upgrades you get:

  • Memory extension to 128 Mpts per channel (option MEM)
  • Sequence/triggered/gated modes (option SEQ) with up to 25 entries and controls for: branching, repeat, wait, jump, go-to, external trigger in, manual trigger, timed trigger, and SCPI command, for building long waveforms with complex and flexible timing.



Simplified ARB waveform creation


The built-in arb editing tool, ArbBuilder, includes all operations to create, edit and transfer an ARB waveform, eliminating the need to connect or transfer files to a PC. The amplitude and offset data is stored in the waveform, removing the need to adjust the settings after loading a normalized arb.


Smart user interface

Learn faster and work quicker with the largest AFG touchscreen on the market. The 9-inch screen works just like a smart device so you can pinch, zoom and scroll to easily locate settings and parameters on the simplified menu and find shortcuts to frequently used settings.


 AFG31000 Smarter User Interface


Need more than two channels?


If you need more than two channels of waveforms to stimulate your device under test (DUT), multi-sync enables you to quickly sync up two or more units. The onscreen wizard will lead you through the process of cable connections and settings in less than three minutes.


Strength in Numbers


  • 1 or 2 channel models

  • Output amplitude range 1 mVp-p to 10 Vp-p into 50Ω loads


  • Basic (AFG) mode
    • 25 MHz, 50 MHz, 100 MHz, 150 MHz or 250 MHz sine waveforms

    • 250 MSa/s, 500 MSa/s, 1 GSa/s or 2GSa/s sample rate

    • 14-bit vertical resolution

    • Continuous, modulation, sweeping and burst run modes

    • 128 kpts arbitrary waveform memory in each channel

  • Advanced mode

    • Continuous mode and optional sequence, triggered and gated modes

    • 16 Mpts arbitrary waveform memory in each channel (128 Mpts optional)

    • Up to 256 steps in sequence mode with loop, jump and wait events

    • Variable sample clock 1 µSa/s to 2 GSa/s

    • Minimum waveform length 168pts with granularity of 1 point


Reduce noise and jitter by 10x


Jitter from an AFG31000 (upper waveform) vs previous generation AFG (lower waveform)


With a lower noise floor and output amplitude down to 1mVpp – the noise and jitter specs are 10x better than last generation technology ensuring clarity and fidelity for your test.





Online upgrades

The software-based architecture means you can upgrade your AFG31000 directly from our website, with new options to keep evolving with your needs.


Currently available

  • Bandwidth upgrade
  • Memory size upgrade
  • Waveform sequencing upgrade



Model Analog
Output Amplitude
into 50 ohms
memory size
Sample Rate Contact


1 25 MHz 1 mVpp to 10 Vpp 16 MSa/ch 14 bits Config&Quote_buttonTek_Vivid_Green


 2  25 MHz 1 mVpp to 10 Vpp 16 MSa/ch  14 bits Config&Quote_buttonTek_Vivid_Green


 1  50 MHz  1 mVpp to 10 Vpp  16 MSa/ch  14 bits Config&Quote_buttonTek_Vivid_Green


 2  50 MHz  1 mVpp to 10 Vpp  16 MSa/ch   14 bits Config&Quote_buttonTek_Vivid_Green


1  100 MHz  1 mVpp to 10 Vpp  16 MSa/ch   14 bits Config&Quote_buttonTek_Vivid_Green


 2  100 MHz  1 mVpp to 10 Vpp  16 MSa/ch   14 bits Config&Quote_buttonTek_Vivid_Green


1  150 MHz  1 mVpp to 5 Vpp  16 MSa/ch   14 bits Config&Quote_buttonTek_Vivid_Green


 2  150 MHz  1 mVpp to 5 Vpp  16 MSa/ch   14 bits Config&Quote_buttonTek_Vivid_Green


1  250 MHz  1 mVpp to 5 Vpp  16 MSa/ch   14 bits Config&Quote_buttonTek_Vivid_Green


 2 250 MHz 1 mVpp to 5 Vpp 16 MSa/ch  14 bits Config&Quote_buttonTek_Vivid_Green


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Analog circuit characterization

AFG31000 Analog Circuit Characterisation



This is an analog world. All physical quantities are captured and presented as an analog signal. Thus, performance of analog circuits like amplifiers, filters and convertors need to be characterized.

  • InstaView™ technology eliminates the uncertainty of the waveform added at a DUT with unmatched impedance

  • Frequency range from 25 MHz up to 250 MHz

  • High signal fidelity eliminates the need for an external filter or attenuator

  • Frequency response tests are effortless due to frequency agility and well-calibrated sine wave flatness



Real-world signal replication

Sensors are widely used in almost every modern electronic design, from automotive, to medical devices, to consumer electronics. Capturing a waveform then replicating it for troubleshooting or validation with an AFG has been a challenging process until now.

  • ArbBuilder imports waveforms in csv format saved by the wide portfolio of Tektronix oscilloscopes

  • Up-to 128 Mpts arbitrary memory greatly extends the length of a signal

  • Low noise floor gives the cleanest signal


AFG31000 Real-world Signal Replication


Function verification and performance characterization

AFG31000 Function Verification and Performance Characterisation



An intensive number of test cases must be done by test engineers before a product goes to a market to ensure it meets the specifications. But this process is time consuming and repetitive.

  • Full programability for automated testing and intuitive user interface for manual test

  • Waveform sequencing enables you to serialize all test cases in a single sequence

  • Flexible branching methods allows high efficiency

  • Up to 128 Mpts of arbitrary memory and built-in non-volatile flash memory store all of your waveforms and test cases



System synchronization with clock or pulses

All parts of a circuit in a digital design work synchronously at the pace of a clock. All devices in a big system must be coordinated with triggered signals to ensure they work properly and reliably. The AFG31000 is a cost-effective way to generate the clocks and triggerring pulses.

  • Pulse/square frequency range up to 160 MHz

  • Frequency agility seamlessly switches from one clock rate to another

  • Easy-to-use wizard guides you through the process of synchronizing multiple units to extend the number of channels

  • Low jitter level gives you more confidence in triggering your system


AFG31000 System Synchronisation with clock or pulses


Pulses to drive power devices

AFG31000 Pulses to Drive Power Devices


Dynamic performance characterization of IGBT or MOSFET requires pulses to drive the gate to turn it on or off.

  • Easy pulse generation with adjustable duty cycle and edge time

  • Waveform sequencing for pulse train generation with flexible timing

  • Built-in noise generator and floating ground for adding noise to DC power supply for stress test

  • Output channels are protected from overcurrent to minimize down time



Advanced research and education

Researchers and educators need a wide variety of signals to get their research and teaching job done. Tests could be as simple as a series of pulses to simulate the output of a Geiger-Muller counter or as complicated as a long modulated baseband IQ.

  • InstaView™ technology eliminates the uncertainty of the waveform added at your complex load

  • Versatility of features and functions integrated

  • Dual operation modes balance ease-of-use and flexibility to generate the most complex waveforms

  • Built-in ArbBuilder enables you to generate and edit arbitrary waveforms directly on the screen


AFG31000 Advanced Research and Education


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