2601B-PULSE |
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System SourceMeter® 10 μsec Pulser/SMU Instrument |
The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test. |
Achieve high pulse fidelity without manual pulse tuning |
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The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 μH, ensuring your pulse has no overshoot and ringing when outputting pulses from 10 μs up to 500 μs at any current level up to 10 amps. With pulse rise times < 1.7 μs, you can properly characterize your device or circuit under test.
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Incorporates the functionality of a fast pulser and SMU in one instrument |
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The 2601B-PULSE adds pulser functionality to the superior measurement integrity, synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.
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Embedded scripting and connectivity for unmatched production throughput |
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Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.
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Models
Model |
Channels |
Max Current Source/Measure Range |
Max Voltage Source/Measure Range |
Measurement Resolution (Current/Voltage) | Power |
2601B-PULSE |
1 | 10 A |
40 V |
100 fA / 100 nV |
Pulser: 100 W instantaneous |
Applications
Simplified Pulsed/DC I/V Characterization of LEDs |
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The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.
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On Wafer Semiconductor Testing |
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Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.
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Software
Keithley KickStart Instrument Control Software. No Programming Required. |
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Making measurements is easy with KickStart. Characterize your devices and materials quickly and easily without programming. Visualize real-time results in graphical and tabular format. Export data tables or graphs for quick reporting or additional analysis in Excel.
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Embedded scripting and connectivity for unmatched production throughput |
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Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.
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